GaAs基半导体量子点激光器管芯质量的检测和分析方法


Autoria(s): 梁凌燕; 叶小玲; 徐波; 陈涌海; 王占国
Data(s)

02/07/2008

Resumo

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Identificador

http://ir.semi.ac.cn/handle/172111/4093

http://www.irgrid.ac.cn/handle/1471x/61528

Idioma(s)

中文

Fonte

梁凌燕;叶小玲;徐波;陈涌海;王占国,GaAs基半导体量子点激光器管芯质量的检测和分析方法 ,200610169748,20061228

Tipo

专利