一种对气体传感器或半导体器件性能进行测试的系统


Autoria(s): 王晓亮; 王新华; 冯春; 王保柱; 马志勇; 王军喜; 胡国新; 肖红领; 冉军学; 王翠梅
Data(s)

12/03/2008

Resumo

Submitted by zhangdi (zhangdi@red.semi.ac.cn) on 2009-06-04T08:36:34Z No. of bitstreams: 1 dspace.cfg: 33388 bytes, checksum: ac9630d3fdb36a155287a049e8b34eb7 (MD5)

Made available in DSpace on 2009-06-04T08:36:35Z (GMT). No. of bitstreams: 1 dspace.cfg: 33388 bytes, checksum: ac9630d3fdb36a155287a049e8b34eb7 (MD5) Previous issue date: 2008-08

Made available in DSpace on 2009-06-11T08:58:17Z (GMT). No. of bitstreams: 1 full/200610112883.pdf: 996567 bytes, checksum: 80e020a35cff196130539ab98ebcaee6 (MD5) Previous issue date:

Identificador

http://ir.semi.ac.cn/handle/172111/3975

http://www.irgrid.ac.cn/handle/1471x/61469

Idioma(s)

中文

Fonte

王晓亮;王新华;冯春;王保柱;马志勇;王军喜;胡国新;肖红领;冉军学;王翠梅,一种对气体传感器或半导体器件性能进行测试的系统 ,200610112883,20060906

Tipo

专利