便携式多信道光电子芯片测试信号发生装置及测试方法


Autoria(s): 李运涛; 陈少武; 余金中
Data(s)

13/06/2007

Resumo

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Identificador

http://ir.semi.ac.cn/handle/172111/3745

http://www.irgrid.ac.cn/handle/1471x/61354

Idioma(s)

中文

Fonte

李运涛;陈少武;余金中,便携式多信道光电子芯片测试信号发生装置及测试方法 ,200510126240,20051130

Tipo

专利