用于电调制光致发光光谱测量的样品架


Autoria(s): 丛光伟; 彭文琴; 吴洁君; 魏宏源; 刘祥林; 王占国
Data(s)

05/07/2006

Resumo

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Identificador

http://ir.semi.ac.cn/handle/172111/3427

http://www.irgrid.ac.cn/handle/1471x/61195

Idioma(s)

中文

Fonte

丛光伟;彭文琴;吴洁君;魏宏源;刘祥林;王占国,用于电调制光致发光光谱测量的样品架,200410098998,20041223

Tipo

专利