高击穿电压的高电子迁移率晶体管


Autoria(s): 徐晓华; 倪海桥; 牛智川; 贺正宏; 王建林
Data(s)

14/12/2005

Resumo

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Identificador

http://ir.semi.ac.cn/handle/172111/3139

http://www.irgrid.ac.cn/handle/1471x/61051

Idioma(s)

中文

Fonte

徐晓华;倪海桥;牛智川;贺正宏;王建林,高击穿电压的高电子迁移率晶体管 ,CN200410046387.0,20040608

Tipo

专利