采用TEOS源PECVD生长氧化硅厚膜的方法


Autoria(s): 雷红兵; 王红杰; 胡雄伟; 邓晓清; 王启明
Data(s)

27/03/2002

Resumo

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Identificador

http://ir.semi.ac.cn/handle/172111/3055

http://www.irgrid.ac.cn/handle/1471x/61009

Idioma(s)

中文

Fonte

雷红兵;王红杰;胡雄伟;邓晓清;王启明,采用TEOS源PECVD生长氧化硅厚膜的方法 ,CN00124309.8,20000904

Tipo

专利