Effects of AlGaN/AlN Stacked Interlayers on GaN Growth on Si (111)


Autoria(s): Wang H (Wang Hui); Liang H (Liang Hu); Wang Y (Wang Yong); Ng KW (Ng Kar-Wei); Deng DM (Deng Dong-Mei); Lau KM (Lau Kei-May)
Data(s)

2010

Resumo

We report the growth of high quality and crack-free GaN film on Si (111) substrate using Al0.2Ga0.8N/AlN stacked interlayers. Compared with the previously used single AlN interlayer, the AlGaN/AlN stacked interlayers can more effectively reduce the tensile stress inside the GaN layer. The cross-sectional TEM image reveals the bending and annihilation of threading dislocations (TDs) in the overgrown GaN film which leads to a decrease of TD density.

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国际

Identificador

http://ir.semi.ac.cn/handle/172111/11188

http://www.irgrid.ac.cn/handle/1471x/60796

Idioma(s)

英语

Fonte

Wang H (Wang Hui), Liang H (Liang Hu), Wang Y (Wang Yong), Ng KW (Ng Kar-Wei), Deng DM (Deng Dong-Mei), Lau KM (Lau Kei-May) .Effects of AlGaN/AlN Stacked Interlayers on GaN Growth on Si (111).CHINESE PHYSICS LETTERS,2010,27(3):Art. No. 038103

Palavras-Chave #光电子学 #VAPOR-PHASE EPITAXY #TEMPERATURE ALN INTERLAYERS #CRACK-FREE GAN #STRESS-CONTROL #SI(111) #DEPOSITION #REDUCTION #THICKNESS #NITRIDE #LAYERS
Tipo

期刊论文