The refractive nonlinearities of InAs/GaAs quantum dots above-bandgap energy


Autoria(s): Huang X; Zhang XH; Zhu YG; Li T; Han LF; Shang XJ; Ni HQ; Niu ZC
Data(s)

2010

Resumo

The third-order optical nonlinear refractive properties of InAs/GaAs quantum dots grown by molecular beam epitaxy have been measured using the reflection Z-scan technique at above-bandgap energy. The nonlinear refractive index and nonlinear absorption index of the InAs/GaAs quantum dots were determined for wavelengths from 740 to 777 nm. The measured results are compared with the nonlinear refractive response of several typical III-V group semiconductor materials. The corresponding mechanisms responsible for the large nonlinear response are discussed.

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National Natural Science Foundation of China 10674131 60625405 10734060

其它

National Natural Science Foundation of China 10674131 60625405 10734060

Identificador

http://ir.semi.ac.cn/handle/172111/11181

http://www.irgrid.ac.cn/handle/1471x/60716

Idioma(s)

英语

Fonte

Huang X, Zhang XH, Zhu YG, Li T, Han LF, Shang XJ, Ni HQ, Niu ZC.The refractive nonlinearities of InAs/GaAs quantum dots above-bandgap energy.OPTICS COMMUNICATIONS,2010,283(7):1510-1513

Palavras-Chave #半导体物理 #InAs quantum dots #Nonlinear refraction #Reflection Z-scan #REFLECTION Z-SCAN #OPTICAL NONLINEARITIES #2-PHOTON ABSORPTION #SATURABLE ABSORBER #WELL STRUCTURES #SINGLE-BEAM #ELECTROABSORPTION #DISPERSION #SOLIDS #GAAS
Tipo

期刊论文