高速电光强度调制器和光电探测器频率响应测试方法研究


Autoria(s): 黄亨沛
Contribuinte(s)

祝宁华

Data(s)

2007

Resumo

Submitted by zhangdi (zhangdi@red.semi.ac.cn) on 2009-04-13T11:45:31Z

Made available in DSpace on 2009-04-13T11:45:31Z (GMT).

Made available in DSpace on 2009-07-09T01:36:46Z (GMT). No. of bitstreams: 1 disk/eh2007/hhp.pdf: 2119002 bytes, checksum: a6f663df4f98f35b2dcc97745408bf82 (MD5) Previous issue date: 2007

Identificador

http://ir.semi.ac.cn/handle/172111/5775

http://www.irgrid.ac.cn/handle/1471x/60449

Idioma(s)

中文

Fonte

黄亨沛.高速电光强度调制器和光电探测器频率响应测试方法研究.[博士].北京.中国科学院半导体研究所.2007

Palavras-Chave #微电子学与固体电子学
Tipo

学位论文