HWCVD低温制备器件质量的微晶硅薄膜


Autoria(s): 汪六九
Contribuinte(s)

朱美芳

Data(s)

2003

Resumo

Submitted by zhangdi (zhangdi@red.semi.ac.cn) on 2009-04-13T11:45:31Z

Made available in DSpace on 2009-04-13T11:45:31Z (GMT).

Made available in DSpace on 2009-07-09T01:35:53Z (GMT). No. of bitstreams: 1 disk/eh2003/wlj.pdf: 1469114 bytes, checksum: a2877e2d40f227ffc6b649676615e633 (MD5) Previous issue date: 2003

Identificador

http://ir.semi.ac.cn/handle/172111/5243

http://www.irgrid.ac.cn/handle/1471x/60183

Idioma(s)

中文

Fonte

汪六九.HWCVD低温制备器件质量的微晶硅薄膜.[硕士].北京.中国科学院半导体研究所.2003

Palavras-Chave #材料物理与化学
Tipo

学位论文