集成电路测试系统的结构分析和集成化研究
Contribuinte(s) |
林雨 |
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Data(s) |
2002
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Resumo |
Submitted by zhangdi (zhangdi@red.semi.ac.cn) on 2009-04-13T11:45:31Z Made available in DSpace on 2009-04-13T11:45:31Z (GMT). Made available in DSpace on 2009-07-09T01:35:44Z (GMT). No. of bitstreams: 1 disk/eh2002/wdh.pdf: 1805255 bytes, checksum: 84c6618813035632bef5b1612fc1145e (MD5) Previous issue date: 2002 |
Identificador | |
Idioma(s) |
中文 |
Fonte |
王东辉.集成电路测试系统的结构分析和集成化研究.[博士].北京.中国科学院半导体研究所.2002 |
Palavras-Chave | #微电子学与固体电子学 |
Tipo |
学位论文 |