集成电路测试系统的结构分析和集成化研究


Autoria(s): 王东辉
Contribuinte(s)

林雨

Data(s)

2002

Resumo

Submitted by zhangdi (zhangdi@red.semi.ac.cn) on 2009-04-13T11:45:31Z

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Identificador

http://ir.semi.ac.cn/handle/172111/5135

http://www.irgrid.ac.cn/handle/1471x/60129

Idioma(s)

中文

Fonte

王东辉.集成电路测试系统的结构分析和集成化研究.[博士].北京.中国科学院半导体研究所.2002

Palavras-Chave #微电子学与固体电子学
Tipo

学位论文