Electrical conductivity evaluation of postharvest strawberry damage

Autoria(s): Jiang Y; Shiina T; Nakamura N; Nakahara A
Data(s)

2001
Identificador

http://ir.scbg.ac.cn/handle/344003/3945

http://www.irgrid.ac.cn/handle/1471x/16574
Fonte

Jiang Y； Shiina T； Nakamura N； Nakahara A .Electrical conductivity evaluation of postharvest strawberry damage,Journal of Food Science,2001,66(9):1392-1395
Tipo

期刊论文
Acesso ao item digital