Y2O3 stabilized ZrO2 thin films deposited by electron-beam evaporation:Optical properties, structure and residual stresses

Autoria(s): Xiao QL(肖祁陵); Xu C(许程); Shao SY(邵淑英); Shao JD(邵建达); Fan ZX(范正修)
Data(s)

2009
Identificador

http://ir.siom.ac.cn/handle/181231/6713

http://www.irgrid.ac.cn/handle/1471x/12999
Idioma(s)

中文
Fonte

肖祁陵,许程,邵淑英,邵建达,范正修.Y2O3 stabilized ZrO2 thin films deposited by electron-beam evaporation:Optical properties, structure and residual stresses.Vacuum,2009,83:366-371
Palavras-Chave #YSZ thin films #Residual stress #Electron-beam evaporation #Refractive index #Structural properties
Tipo

期刊论文
Acesso ao item digital