Investigation on thermal stability of TiO2 films for application at high temperature


Autoria(s): 姚建可; Huang H. L.; Xu C.; Ma J. Y.; He H. B.; Shao J. D.; Jin Y. X.; Zhao Y. A.; Fan Z. X.; Zhang F.; Wu Z. Y.
Data(s)

2009

Resumo

The thermal stability of electron beam deposited TiO2 monolayers and TiO2/SiO2 high reflectors (HR) during 300 to 1100 degrees C annealing is studied. It is found that the optical loss of film increases with the increase in annealing temperature, due to the phase change, crystallisation and deoxidising of film. Scattering loss dominates the optical property degradation of film below 900 degrees C, while the absorption is another factor at 1100 degrees C. The increase in refractive index and decrease in physical thickness of TiO2 layer shift the spectra of HR above 900 degrees C. The possible crack mechanism on the surface of HR during annealing is discussed. Guidance for application on high temperature stable optical coatings is given.

Identificador

http://ir.siom.ac.cn/handle/181231/4782

http://www.irgrid.ac.cn/handle/1471x/12968

Idioma(s)

英语

Fonte

姚建可;Huang H. L.;Xu C.;Ma J. Y.;He H. B.;Shao J. D.;Jin Y. X.;Zhao Y. A.;Fan Z. X.;Zhang F.;Wu Z. Y..,Surf. Eng.,2009,25(2):116-119

Palavras-Chave #光学薄膜 #TiO2/SiO2 high reflectors #High temperature thermal stability #Scattering #Absorption #Refractive index #Crack
Tipo

期刊论文