Effects of deposition rates on laser damage threshold of TiO2/SiO2 high reflectors
Data(s) |
2009
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Resumo |
TiO2 single layers and TiO2/SiO2 high reflectors (HR) are prepared by electron beam evaporation at different TiO2 deposition rates. It is found that the changes of properties of TiO2 films with the increase of rate, such as the increase of refractive index and extinction coefficient and the decrease of physical thickness, lead to the spectrum shift and reflectivity bandwidth broadening of HR together with the increase of absorption and decrease of laser-induced damage threshold. The damages are found of different morphologies: a shallow pit to a seriously delaminated and deep crater, and the different amorphous-to-anatase-to-rutile phase transition processes detected by Raman study. The frequency shift of Raman vibration mode correlates with the strain in. film. Energy dispersive X-ray analysis reveals that impurities and non-stoichiometric defects are two absorption initiations resulting to the laser-induced transformation. (C) 2008 Elsevier B. V. All rights reserved. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
姚建可;Xu Cheng;麻健勇;Fang Ming;范正修;Jin Yunxia;Zhao Yuanan;贺洪波;邵建达.,Appl. Surf. Sci.,2009,255(9):4733-4737 |
Palavras-Chave | #光学薄膜 #TiO2/SiO2 high reflectors #Laser damage #Deposition rate #Electron beam evaporation #Raman spectra #Energy dispersive X-ray analysis |
Tipo |
期刊论文 |