Characterization of LaF<inf>3</inf> coatings prepared at different temperatures and rates


Autoria(s): Yu Hua; Shen Yanming; Cui Yun; Qi Hongji; 邵建达; 范正修
Data(s)

2008

Resumo

LaF3 thin films were prepared by thermal boat evaporation at different substrate temperatures and various deposition rates. X-ray diffraction (XRD), Lambda 900 spectrophotometer and X-ray photoelectron spectroscopy (XPS) were employed to study crystal structure, transmittance and chemical composition of the coatings, respectively. Laser-induce damage threshold (LIDT) was determined by a tripled Nd:YAG laser system with a pulse width of 8 ns. It is found that the crystal structure became more perfect and the refractive index increased gradually with the temperature rising. The LIDT was comparatively high at high temperature. In the other hand, the crystallization status also became better and the refractive index increased when the deposition rate enhanced at a low level. If the rate was super rapid, the crystallization worsened instead and the refractive index would lessen greatly. On the whole, the LIDT decreased with increasing rate. (C) 2007 Elsevier B.V. All rights reserved.

Identificador

http://ir.siom.ac.cn/handle/181231/4752

http://www.irgrid.ac.cn/handle/1471x/12953

Idioma(s)

英语

Fonte

Yu Hua;Shen Yanming;Cui Yun;Qi Hongji;邵建达;范正修 .,Appl. Surf. Sci.,2008,254(6):1783-1788

Palavras-Chave #光学薄膜 #LaF3 film #substrate temperature #deposition rate #LIDT
Tipo

期刊论文