用于掺钛蓝宝石激光系统的高反膜的激光损伤
Data(s) |
2007
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Resumo |
用电子束蒸发制备了用于掺钛蓝宝石啁啾脉冲放大激光系统的TiO2/HfO2/SiO2高反膜,其带宽约为176nm(R>98%, λ0=800nm),激光损伤阈值(LIDT)为2.4 J/cm2。通过TiO2和HfO2单层膜的透过光谱计算了这两种材料的折射率和消光系数。高反膜的性能主要由高折射率材料决定:折射率越高,反射带越宽;消光系数越小,薄膜吸收越小,LIDT越高。最后,讨论了高反膜的激光损伤机制。 A broadband (~176 nm, R>98%, 'lambda'0=800 nm) and high laser-induced damage threshold (LIDT=2.4J/cm2) TiO2/HfO2/SiO2 high reflector (HR) for Ti:sapphire chirped-pulse amplification (CPA) laser system is fabricated by the electron beam evaporation. The refractive index and extinction coefficient of TiO2 and HfO2 films are calculated from single-layer films' transmittance spectra. The properties of HR are mainly determined by the high refractive index material. The high refractive index leads to wide bandwidth. A low extinction coefficient indicates low absorption and high LIDT. The possible damage mechanism of HR is discussed. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
姚建可;曾维强;范正修;贺洪波;邵建达.用于掺钛蓝宝石激光系统的高反膜的激光损伤,Chin. Opt. Lett.,2007,5(12):724-726 |
Palavras-Chave | #光学薄膜 #电子束蒸发 #TiO2/HfO2/SiO2高反膜 #带宽 #激光损伤阈值 #掺钛蓝宝石激光系统 #Bandwidth #Electron beams #Evaporation #Refractive index #Solid state lasers |
Tipo |
期刊论文 |