Investigation on the properties of high reflective mirror prepared by ion-beam sputtering


Autoria(s): Jianbing Huang; Guanglei Tian; Jianda Shao; 范正修
Data(s)

2005

Resumo

The single-sided and dual-sided high reflective mirrors were deposited with ion-beam sputtering (IBS). When the incident light entered with 45 degrees, the reflectance of p-polarized light at 1064 nm exceeded 99.5%. Spectrum was gained by spectrometer and weak absorption of coatings was measured by surface thermal lensing (STL) technique. Laser-induced damage threshold (LIDT) was determined and the damage morphology was observed with Lecia-DMRXE microscope simultaneously. The profile of coatings was measured with Mark III-GPI digital interferometer. It was found that the reflectivity of mirror exceeded 99.9% and its absorption was as low as 14 ppm. The reflective bandwidth of the dual-sided sample was about 43 nm wider than that of single-sided sample, and its LIDT was as high as 28 J/cm2, which was 5 J/cm2 higher than that of single-sided sample. Moreover, the profile of dual-sided sample was better than that of substrate without coatings.

Identificador

http://ir.siom.ac.cn/handle/181231/4422

http://www.irgrid.ac.cn/handle/1471x/12788

Idioma(s)

英语

Fonte

Jianbing Huang;Guanglei Tian;Jianda Shao;范正修.Investigation on the properties of high reflective mirror prepared by ion-beam sputtering,Chin. Opt. Lett.,2005,3(11):676-678

Palavras-Chave #光学薄膜 #thin films #310.6870 #thin films #other properties
Tipo

期刊论文