Investigation on the properties of high reflective mirror prepared by ion-beam sputtering
Data(s) |
2005
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Resumo |
The single-sided and dual-sided high reflective mirrors were deposited with ion-beam sputtering (IBS). When the incident light entered with 45 degrees, the reflectance of p-polarized light at 1064 nm exceeded 99.5%. Spectrum was gained by spectrometer and weak absorption of coatings was measured by surface thermal lensing (STL) technique. Laser-induced damage threshold (LIDT) was determined and the damage morphology was observed with Lecia-DMRXE microscope simultaneously. The profile of coatings was measured with Mark III-GPI digital interferometer. It was found that the reflectivity of mirror exceeded 99.9% and its absorption was as low as 14 ppm. The reflective bandwidth of the dual-sided sample was about 43 nm wider than that of single-sided sample, and its LIDT was as high as 28 J/cm2, which was 5 J/cm2 higher than that of single-sided sample. Moreover, the profile of dual-sided sample was better than that of substrate without coatings. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Jianbing Huang;Guanglei Tian;Jianda Shao;范正修.Investigation on the properties of high reflective mirror prepared by ion-beam sputtering,Chin. Opt. Lett.,2005,3(11):676-678 |
Palavras-Chave | #光学薄膜 #thin films #310.6870 #thin films #other properties |
Tipo |
期刊论文 |