Weak absorption test and defect analysis of optical coatings

Autoria(s): 贺洪波 (SIOM); Li Xia; Fan Shu-Hai; Zhao Yuan-An; Shao Jian-Da; Fan Zheng-Xiu
Data(s)

2005
Identificador

http://ir.siom.ac.cn/handle/181231/4382

http://www.irgrid.ac.cn/handle/1471x/12768
Idioma(s)

英语
Fonte

贺洪波 (SIOM);Li Xia;Fan Shu-Hai;Zhao Yuan-An;Shao Jian-Da;Fan Zheng-Xiu.,光学 精密工程,2005,13(4):430-434
Palavras-Chave #光学薄膜
Tipo

期刊论文
Acesso ao item digital