Damage on HfO2/SiO2 high-reflecting coatings under single and multiple Nd:YAG laser pulse irradiation
Data(s) |
2005
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Resumo |
The single- and multi-shot damage behaviors of HfO2/SiO2 high-reflecting (HR) coatings under Nd:YAG laser exposure were investigated. Fundamental aspects of multi-shot laser damage, such as the instability due to pulse-to-pulse accumulation of absorption defect and structural defect effect, and the mechanism of laser induced defect generation, are considered. It was found in multi-shot damage, the main factors influencing laser-induced damage threshold (LIDT) are accumulation of irreversible changes of structural defects and thermal stress that induced by thermal density fluctuations. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Weidong Gao;Tao Wang;Yuanan Zhao;Jianda Shao.,Chin. Opt. Lett.,2005,3(3):179-180 |
Palavras-Chave | #光学薄膜 #thin films #310.6870 #thin films #other properties |
Tipo |
期刊论文 |