The effects of oxygen partial pressure on the optical absorption edge and the UV emission energy of ZnO films


Autoria(s): Ruijin Hong; Jianda Shao; Hongbo He; 范正修
Data(s)

2005

Resumo

The optical absorption edge and ultraviolet (UV) emission energy of ZnO films deposited by direct current (DC) reactive magnetron sputtering at room temperature have been investigated. With the oxygen ratio increasing, the structure of films changes from zinc and zinc oxide coexisting phase to single-phase ZnO and finally to the highly (002) orientation. Both the grain size and the stress of ZnO film vary with the oxygen partial pressure. Upon increasing the oxygen partial pressure in the growing ambient, the visible emission in the room-temperature photoluminescence spectra was suppressed without sacrificing the band-edge emission intensity in the ultraviolet region. The peaks of photoluminescence spectra were located at 3.06---3.15 eV. From optical transmittance spectra of ZnO films, the optical band gap edge was observed to shift towards shorter wavelength with the increase of oxygen partial pressure.

Identificador

http://ir.siom.ac.cn/handle/181231/4366

http://www.irgrid.ac.cn/handle/1471x/12760

Idioma(s)

英语

Fonte

Ruijin Hong;Jianda Shao;Hongbo He;范正修.,Chin. Opt. Lett.,2005,3(7):428-431

Palavras-Chave #光学薄膜 #thin films #300.6470 #spectroscopy #semiconductors #310.6860 #thin films #optical properties #170.6280 #spectroscopy #fluorescence and luminescence
Tipo

期刊论文