基于Berreman矩阵的双折射薄膜光谱响应特性计算

采用Berreman特征矩阵方法，通过数值计算研究了双折射薄膜的反射、透射等光谱响应特性。依据电磁场理论的电场分量、磁场分量的界面连续条件，推导了光波在各向异性双轴薄膜中的Berreman转移矩阵，用以分析含有各向异性介质层的复杂薄膜系统的光学性质。这些矩阵递推关系包含了界面处的多点反射，适用于一般的各向异性的多层膜系统，包括入射媒质或基底为各向异性的情况。在文中给出了各向同性入射媒质双轴各向异性膜层一各向同性基底薄膜系统的计算结果，验证了该计算方法的可行性，以此作为进一步研究各向异性薄膜和相关光学薄膜器

The Berreman matrix method is applied to determine the transmission and reflection characteristics of birefringent thin films. Standard boundary conditions are imposed on resultant electric- and magnetic-field vectors at interfaces. A simplified analytic expression for the 4×4 propagation matrix of a general homogeneous biaxial layers is derived. Thus simple matricial relations are obtained for transmitted and reflected electric-field amplitudes of birefringent thin films. These matricial recurrence relations include multiple reflections while dealing with total fields. This provides support for a more general anisotropic multilayer film system. Example calculations are presented for a special case of isotropic-biaxial-isotropic film system. And these should be the foundation of further research and the design of birefringent thin-film devices.