Layer uniformity of glancing angle deposition


Autoria(s): Wang JH; 邵建达; Yi K; 范正修
Data(s)

2005

Resumo

Some results of an investigation on the layer thickness uniformity of glancing angle deposition are presented. A zirconia monolayer has been deposited by glancing angle deposition to analyze the layer thickness uniformity. The experimental results indicate that the thickness variation over the substrate is less than 0. 1%, which is considered as good uniformity. It is found that the non-uniformity of experimental results is larger than that of the theoretical results. (c) 2005 Elsevier Ltd. All rights reserved.

Identificador

http://ir.siom.ac.cn/handle/181231/4240

http://www.irgrid.ac.cn/handle/1471x/12697

Idioma(s)

英语

Fonte

Wang JH;邵建达;Yi K;范正修.,Vacuum,2005,78(1):107-111

Palavras-Chave #光学薄膜 #e-beam evaporation #glancing angle deposition #layer uniformity
Tipo

期刊论文