Determination of fine layer structure in Ni/C multilayer

Autoria(s): Songwen Deng; Hongji Qi; Chaoyang Wei; Kui Yi; Zhengxiu Fan; Jianda Shao
Data(s)

28/04/2010
Identificador

http://ir.siom.ac.cn/handle/181231/6657

http://www.irgrid.ac.cn/handle/1471x/12619
Idioma(s)

中文
Fonte

Deng SW(邓淞文).Determination of fine layer structure in Ni/C multilayer.见:Frontiers of optical coatings.西安.2009-09.
Palavras-Chave #其他
Tipo

会议论文
Acesso ao item digital