Epitaxial growth of ZnO thin films on LiGaO2 substrates by pulsed-laser deposition


Autoria(s): Liu Shiliang; 周圣明; Wang Yinzhen; Zhang Xia; Li Xiaomin; 夏长泰; Hang Yin; 徐军
Data(s)

2006

Resumo

Lattice-matched (Delta(a/a) = 1.8-3.4%) (001) LiGaO2 substrates have been employed for the first time to grow ZnO thin films by pulsed-laser deposition at 350-650 degrees C with oxygen partial pressure of 20Pa. XRD shows that a highly c-axis-oriented ZnO film can be deposited on (001) LiGaO2 substrate at 500 degrees C. AFM images reveal the surfaces of as-deposited ZnO films are smooth and root-mean-square values are 6.662, 5.765 and 6.834 nm at 350, 500 and 650 degrees C, respectively. PL spectra indicate only near-band-edge UV emission appears in the curve of ZnO film deposited at 500 degrees C. The deep-level emission of ZnO film deposited at 650 degrees C probably results from Li diffusion into the film. All the results illustrate substrate temperature plays a pretty important role in obtaining ZnO film with a high quality on LiGaO2 substrate by pulsed-laser deposition. (c) 2006 Elsevier B.V. All rights reserved.

Identificador

http://ir.siom.ac.cn/handle/181231/5481

http://www.irgrid.ac.cn/handle/1471x/12212

Idioma(s)

英语

Fonte

Liu Shiliang;周圣明;Wang Yinzhen;Zhang Xia;Li Xiaomin;夏长泰;Hang Yin;徐军.,J. Cryst. Growth,2006,292(1):125-128

Palavras-Chave #光学材料;晶体 #epitaxial growth #pulsed-laser deposition #LiGaO2 substrates #ZnO thin films
Tipo

期刊论文