Epitaxial growth of ZnO thin films on LiGaO2 substrates by pulsed-laser deposition
Data(s) |
2006
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Resumo |
Lattice-matched (Delta(a/a) = 1.8-3.4%) (001) LiGaO2 substrates have been employed for the first time to grow ZnO thin films by pulsed-laser deposition at 350-650 degrees C with oxygen partial pressure of 20Pa. XRD shows that a highly c-axis-oriented ZnO film can be deposited on (001) LiGaO2 substrate at 500 degrees C. AFM images reveal the surfaces of as-deposited ZnO films are smooth and root-mean-square values are 6.662, 5.765 and 6.834 nm at 350, 500 and 650 degrees C, respectively. PL spectra indicate only near-band-edge UV emission appears in the curve of ZnO film deposited at 500 degrees C. The deep-level emission of ZnO film deposited at 650 degrees C probably results from Li diffusion into the film. All the results illustrate substrate temperature plays a pretty important role in obtaining ZnO film with a high quality on LiGaO2 substrate by pulsed-laser deposition. (c) 2006 Elsevier B.V. All rights reserved. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Liu Shiliang;周圣明;Wang Yinzhen;Zhang Xia;Li Xiaomin;夏长泰;Hang Yin;徐军.,J. Cryst. Growth,2006,292(1):125-128 |
Palavras-Chave | #光学材料;晶体 #epitaxial growth #pulsed-laser deposition #LiGaO2 substrates #ZnO thin films |
Tipo |
期刊论文 |