Temperature dependence of thermal properties of Ag8In14Sb55Te23 phase-change memory materials


Autoria(s): Jiao Xinbing; 魏劲松; 干福熹; Xiao Mufei
Data(s)

2009

Resumo

The dependence of thermal properties of Ag8In14Sb55Te23 phase-change memory materials in crystalline and amorphous states on temperature was measured and analyzed. The results show that in the crystalline state, the thermal properties monotonically decrease with the temperature and present obvious crystalline semiconductor characteristics. The heat capacity, thermal diffusivity, and thermal conductivity decrease from 0.35 J/g K, 1.85 mm(2)/s, and 4.0 W/m K at 300 K to 0.025 J/g K, 1.475 mm(2)/s, and 0.25 W/m K at 600 K, respectively. In the amorphous state, while the dependence of thermal properties on temperature does not present significant changes, the materials retain the glass-like thermal characteristics. Within the temperature range from 320 K to 440 K, the heat capacity fluctuates between 0.27 J/g K and 0.075 J/g K, the thermal diffusivity basically maintains at 0.525 mm(2)/s, and the thermal conductivity decreases from 1.02 W/m K at 320 K to 0.2 W/m K at 440 K. Whether in the crystalline or amorphous state, Ag8In14Sb55Te23 are more thermally active than Ge2Sb2Te5, that is, the Ag8In14Sb55Te23 composites bear stronger thermal conduction and diffusion than the Ge2Sb2Te5 phase-change memory materials.

National Natural Science Foundation of China [50772120, 60507009]; Shanghai Key Basic Research [06DJ14007]; National Basic Research Program of China [2007CB935400]

Identificador

http://ir.siom.ac.cn/handle/181231/4087

http://www.irgrid.ac.cn/handle/1471x/11424

Idioma(s)

英语

Fonte

Jiao Xinbing;魏劲松;干福熹;Xiao Mufei.,Appl. Phys. A-Mater. Sci. Process.,2009,94(3):627-631

Palavras-Chave #光存储 #LASER-INDUCED CRYSTALLIZATION #RICH AGINSBTE FILMS #CHANGE OPTICAL DISK #CHANGE MEDIA #DATA-STORAGE #THIN-FILMS #SUPERRESOLUTION #NUCLEATION #MICROSCOPY #GE2SB2TE5
Tipo

期刊论文