Laser pulse induced bumps in chalcogenide phase change films


Autoria(s): 魏劲松; Jiao Xinbing; 干福熹n; Xiao Mufei
Data(s)

2008

Resumo

Formation of bumps in chalcogenide phase change thin films during the laser writing process is theoretically and experimentally investigated. The process involves basically fast heating and quenching stages. Circular bumps are formed after cooling, and the shape and size of the bumps depend on various parameters such as temperatures, laser power, beam size, laser pulse duration, etc. In extreme cases, holes are formed at the apex of the bumps. To understand the bumps and their formation is of great interest for data storage. In the present work, a theoretical model is established for the formation process, and the geometric characters of the formed bumps can be analytically and quantitatively evaluated from various parameters involved in the formation. Simulations based on the analytic solution are carried out taking Ag8In14Sb55Te23 as an example. The results are verified with experimental observations of the bumps. (C) 2008 American Institute of Physics.

Identificador

http://ir.siom.ac.cn/handle/181231/4075

http://www.irgrid.ac.cn/handle/1471x/11418

Idioma(s)

英语

Fonte

魏劲松;Jiao Xinbing;干福熹n;Xiao Mufei .,J. Appl. Phys.,2008,103(12):124516-

Palavras-Chave #光存储 #(e #3e) process #American Institute of Physics (AIP) #Analytic solutions #beam sizes #chalcogenide #Data storage #Experimental observations #formation processes #Laser powering #Laser pulse durations #Laser writing #phase change films #Phase change thin films #Shape and size
Tipo

期刊论文