A Z-scan model for optical nonlinear nanometric films

The Z-scan technique is useful for measuring the nonlinear refractive index of thin films. In conventional Z-scan theories, two effects are often ignored, namely the losses due to the internal multi-interference and the nonlinear absorption inside the sample. Therefore, the theories are restricted to relatively thick films. For films thinner than about 100 nm, the two effects become significant, and thus cannot be ignored. In the present work, we present a Z-scan theory that takes both effects into account. The proposed model calculation is suitable for optical nonlinear films of nanometric thickness. With numerical simulations, we demonstrate dramatic deviations from the conventional Z-scan calculations.

National Natural Science Foundation of China [50772120, 60507009, 60490290]; Shanghai Key Basic Research [06DJ14007]; Chinese Academy of Sciences [KJCXZYW. NANO. 06]; National Basic Research Program of China [2007CB935400]; UNAM-DGAPA Mexico [IN120406-3]