Nonlinear response and optical limiting in SrBi2Ta2O9 thin films


Autoria(s): Gu YZ; Zhang WF; 顾冬红; 干福熹
Data(s)

2001

Resumo

SrBi2Ta2O9 (SBT) thin films on quartz substrates were prepared by use of the pulsed-laser deposition technique. The nonlinear refractive indices, n(2), Of the SBT films were measured by use of z-scan techniques with picosecond pulses. Large negative nonlinear refractive indices of 3.84 and 3.58 cm(2)/GW were obtained for the wavelengths 532 nm and 1.064 mum, respectively. The two-photon absorption coefficient was determined to be 7.3 cm/GW for 532 nm. The limiting behavior of SBT thin film on a quartz substrate was investigated in an f/5 defocusing geometry by use of 38-ps-duration, 532-nm, 1.064-mum. laser excitation. (C) 2001 Optical Society of America.

Identificador

http://ir.siom.ac.cn/handle/181231/3751

http://www.irgrid.ac.cn/handle/1471x/11255

Idioma(s)

英语

Fonte

Gu YZ;Zhang WF;顾冬红;干福熹.,Opt. Lett.,2001,26(22):1788-1790

Palavras-Chave #光存储 #SEMICONDUCTORS #ELECTRODES #ABSORPTION
Tipo

期刊论文