Novel approach to super-resolution pits readout


Autoria(s): We JS; 干福熹
Data(s)

2002

Resumo

We proposed a novel method to realize the readout of super-resolution pits by using a super-resolution reflective film to replace the reflective layer of the conventional ROM. At the same time, by using Sb as the super-resolution reflective layer and SiN as a dielectric layer, the super-resolution pits with diameters of 380 nm were read out by a setup whose laser wavelength is 632.8 nm and numerical aperture is 0.40. In addition, the influence of the Sb thin film thickness on the readout signal was investigated, the results showed that the optimum Sb thin film thickness is 28 to 30 nm, and the maximum CNR is 38 to 40 dB. (C) 2002 Society of Photo-Optical Instrumentation Engineers.

Identificador

http://ir.siom.ac.cn/handle/181231/3735

http://www.irgrid.ac.cn/handle/1471x/11247

Idioma(s)

英语

Fonte

We JS;干福熹.,Opt. Eng.,2002,41(9):2073-2074

Palavras-Chave #光存储 #super-resolution #optical storage #CNR #thin film
Tipo

期刊论文