Primary and secondary threshold intensities of ultraviolet-laser-induced domain nucleation in nearly stoichiometric LiTaO<inf>3</inf>


Autoria(s): 职亚楠; 刘德安; Yan Aimin; 孙建锋; 周煜u; 栾竹; Hang Yin; 刘立人
Data(s)

2008

Resumo

The primary and secondary threshold intensities of ultraviolet-laser-induced preferential domain nucleation in nearly stoichiometric LiTaO3 is observed. The primary threshold is the minimum intensity to achieve the instantaneous preferential domain nucleation within the focus by the combined action of irradiation and electric fields. The secondary threshold is the minimum intensity to achieve the memory effect without any irradiation within the original focus. The space charge field created by the photoionization carriers is thought to be responsible for the instantaneous effect. The explanation based on the formation and transformation of extrinsic defect is presented for the memory effect. (c) 2008 American Institute of Physics.

Identificador

http://ir.siom.ac.cn/handle/181231/2338

http://www.irgrid.ac.cn/handle/1471x/10694

Idioma(s)

英语

Fonte

职亚楠;刘德安;Yan Aimin;孙建锋;周煜u;栾竹;Hang Yin;刘立人 .,Appl. Phys. Lett.,2008,92(8):82904-

Palavras-Chave #Extrinsic defects #Memory effects #Threshold intensities
Tipo

期刊论文