Sputtering of insulators in the electronic stopping region


Autoria(s): Griffith, Joseph Edward
Data(s)

1979

Resumo

Using track detectors we have measured sputtering yields induced by MeV light ions incident on a uranium containing glass, UO<sub>2</sub> and UF<sub>4</sub>. No deviation from the behavior predicted by the Sigmund theory was detected in the glass or the UO<sub>2</sub>. The same was true for UF<sub>4</sub> bombarded with <sup>4</sup>He at 1 MeV and with <sup>16</sup>O and <sup>20</sup>Ne at 100 keV. In contrast to this, 4.75 MeV <sup>19</sup>F(+2) sputters uranium from UF<sub>4</sub> with a yield of 5.6 ± 1.0, which is about 3 orders of magnitude larger than expected from the Sigmund theory. The energy dependence of the yield indicates that it is generated by electronic rather than nuclear stopping processes. The yield depends on the charge state of the incident fluorine but not on the target temperature. We have also measured the energy spectrum of the uranium sputtered from the UF<sub>4</sub>. Ion explosions, thermal spikes, chemical rearrangement and induced desorption are considered as possible explanations for the anomalous yields.

Formato

application/pdf

Identificador

http://thesis.library.caltech.edu/9257/1/Griffith_je_1979.pdf

Griffith, Joseph Edward (1979) Sputtering of insulators in the electronic stopping region. Dissertation (Ph.D.), California Institute of Technology. http://resolver.caltech.edu/CaltechTHESIS:10292015-093835228 <http://resolver.caltech.edu/CaltechTHESIS:10292015-093835228>

Relação

http://resolver.caltech.edu/CaltechTHESIS:10292015-093835228

http://thesis.library.caltech.edu/9257/

Tipo

Thesis

NonPeerReviewed