Measurement of thermal rise-time of a laser diode based on spectrally resolved waveforms
Data(s) |
2006
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Resumo |
Thermal resistance and thermal rise-time are two basic parameters that affect most of the performances of a laser diode greatly. By measuring waveforms received after a spectroscope at wavelengths varied step-by-step, the spectrally resolved waveforms can be converted to calculate the thermal rise-time. Basic formulas for the spectrum variation of a laser diode and the measurement set-up by using a Boxcar are described in the paper. As an example, the thermal rise-time of a p-side up packaged short-pulse laser diode was measured by the method to be 390 mu s. The method will be useful in characterizing diode lasers and LID modules in high-power applications. (c) 2005 Elsevier B.V. All rights reserved. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Chen C;Xin GF;瞿荣辉;方祖捷.,Opt. Commun.,2006,260(1):223-226 |
Palavras-Chave | #laser diode #thermal rise-time #spectrally resolved waveform |
Tipo |
期刊论文 |