Beam quality improvement and focused peak intensity measurement of an intense femtosecond Ti: Sapphire laser system

Autoria(s): Wentao Wang; Yi Cai; Bin Shuai; Wenyao Wang; Yunhua Jiang; Lihuang Lin; Ruxin Li; 徐至展
Data(s)

2006
Identificador

http://ir.siom.ac.cn/handle/181231/758

http://www.irgrid.ac.cn/handle/1471x/9734
Idioma(s)

英语
Fonte

Wentao Wang;Yi Cai;Bin Shuai;Wenyao Wang;Yunhua Jiang;Lihuang Lin;Ruxin Li;徐至展 .,Chin. Opt. Lett.,2006,4(10):583-585
Tipo

期刊论文
Acesso ao item digital