Ultrafast dynamics in ZnO thin films irradiated by femtosecond lasers
Data(s) |
2005
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Resumo |
The damage morphologies, threshold fluences in ZnO films were studied with femtosecond laser pulses. Time-resolved reflectivity and transmissivity have been measured by the pump-probe technique at different pump fluences and wavelengths. The results indicate that two-phase transition is the dominant damage mechanism, which is similar to that in narrow band gap semiconductors. The estimated energy loss rate of conduction electrons is 1.5 eV/ps. (c) 2005 Elsevier Ltd. All rights reserved. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Li CB;冯东海;贾天卿;Sun HY;Li XX;Xu SZ;Wang XF;徐至展.,Solid State Commun.,2005,136(7):389-394 |
Palavras-Chave | #ZnO thin film #laser processing #time-resolved optical measurement #electron energy loss rate |
Tipo |
期刊论文 |