利用x射线激光干涉诊断等离子体电子密度
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2005
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Resumo |
x射线激光探针干涉方法是诊断高温高密度激光等离子体电子密度等信息的重要工具.利用神光Ⅱ装置输出激光驱动的类镍-银x射线激光作为探针,成功地进行了马赫-曾德尔干涉法诊断实验,获得了清晰的包含等离子体信息的动态干涉条纹图像,并据此给出了待测C8H8等离子体临界面附近电子密度的空间分布。 The interferometry with. an x-ray laser as probe is an important tool of diagnosing the electron density of a high temperature and dense plasma. A successful experiment of diagnosing the density of a CH plasma was demonstrated by using a Ni-like Ag x-ray laser as a probe and a Mach-Zehnder interferometer as instrument under the ShenguangII laser facility. The legible interferogram indicating the information of electron density was obtained. |
Identificador | |
Idioma(s) |
中文 |
Fonte |
王琛;王伟;孙今人;方智恒;吴江;傅思祖;马伟新;顾援;王世绩;张国平;郑无敌;张覃鑫;彭惠民;邵平;易葵;林尊琪;王占山;王洪昌;周斌;陈玲燕;金春水.利用x射线激光干涉诊断等离子体电子密度,物理学报,2005,54(1):202-205 |
Palavras-Chave | #激光技术;激光物理与基本理论 #电子密度 #激光等离子体 #光干涉 #x射线激光 #临界面 #激光驱动 #干涉法 #干涉条纹图 #光探针 #高密度 #diagnoses of plasma electron density #x-ray laser #Mach-Zehnder interferometer |
Tipo |
期刊论文 |