Mechanisms of femtosecond laser-induced breakdown and damage in MgO
Data(s) |
2006
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Resumo |
Single-shot laser damage threshold of MgO for 40-986 fs, 800 nm laser pulses is reported. The pump-probe measurements with femtosecond pulses were carried out to investigate the time-resolved electronic excitation processes. A theoretical model including conduction band electrons (CBE) production and laser energy deposition was applied to discuss the roles of multiphoton ionization (MPI) and avalanche ionization in femtosecond laser-induced dielectric breakdown. The results indicate that avalanche ionization plays the dominant role in the femtosecond laser-induced breakdown in MgO near the damage threshold. (c) 2005 Elsevier B.V. All rights reserved. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Xu SZ;贾天卿;Sun HY;Li CB;Li X;冯东海;邱建荣;徐至展.,Opt. Commun.,2006,259(1):274-280 |
Palavras-Chave | #avalanche ionization #laser-induced breakdown #femtosecond laser #time-resolved dynamics #MgO |
Tipo |
期刊论文 |