Mechanisms of femtosecond laser-induced breakdown and damage in MgO


Autoria(s): Xu SZ; 贾天卿; Sun HY; Li CB; Li X; 冯东海; 邱建荣; 徐至展
Data(s)

2006

Resumo

Single-shot laser damage threshold of MgO for 40-986 fs, 800 nm laser pulses is reported. The pump-probe measurements with femtosecond pulses were carried out to investigate the time-resolved electronic excitation processes. A theoretical model including conduction band electrons (CBE) production and laser energy deposition was applied to discuss the roles of multiphoton ionization (MPI) and avalanche ionization in femtosecond laser-induced dielectric breakdown. The results indicate that avalanche ionization plays the dominant role in the femtosecond laser-induced breakdown in MgO near the damage threshold. (c) 2005 Elsevier B.V. All rights reserved.

Identificador

http://ir.siom.ac.cn/handle/181231/314

http://www.irgrid.ac.cn/handle/1471x/9511

Idioma(s)

英语

Fonte

Xu SZ;贾天卿;Sun HY;Li CB;Li X;冯东海;邱建荣;徐至展.,Opt. Commun.,2006,259(1):274-280

Palavras-Chave #avalanche ionization #laser-induced breakdown #femtosecond laser #time-resolved dynamics #MgO
Tipo

期刊论文