Deflections and curvatures of a film-substrate structure with the presence of gradient stress in MEMS applications


Autoria(s): 张吟
Data(s)

2007

Resumo

The close form solutions of deflections and curvatures for a film-substrate composite structure with the presence of gradient stress are derived. With the definition of more precise kinematic assumption, the effect of axial loading due to residual gradient stress is incorporated in the governing equation. The curvature of film-substrate with the presence of gradient stress is shown to be nonuniform when the axial loading is nonzero. When the axial loading is zero, the curvature expressions of some structures derived in this paper recover the previous ones which assume the uniform curvature. Because residual gradient stress results in both moment and axial loading inside the film-substrate composite structure, measuring both the deflection and curvature is proposed as a safe way to uniquely determine the residual stress state inside a film-substrate composite structure with the presence of gradient stress.

Identificador

http://dspace.imech.ac.cn/handle/311007/34009

http://www.irgrid.ac.cn/handle/1471x/2853

Idioma(s)

英语

Fonte

Journal of Micromechanics and Microengineering.2007,17(4):753-762

Palavras-Chave #Thin-Films #Micromachined Beams #Residual-Stress #Cantilever Beam #Stoney Formula #Surface Stress #Strain #Bilayer #Systems #Model
Tipo

期刊论文