On the formation of well-aligned ZnO nanowall networks by catalyst-free thermal evaporation method


Autoria(s): Yin ZG; 陈诺夫; 戴瑞烜; Liu L; Zhang XW; Wang XH; Wu JL; Chai CL
Data(s)

2007

Resumo

Two-dimensional ZnO nanowall networks were grown on ZnO-coated silicon by thermal evaporation at low temperature without catalysts or additives. All of the results from scanning electronic spectroscope, X-ray diffraction and Raman scattering confirmed that the ZnO nanowalls were vertically aligned and c-axis oriented. The room-temperature photoluminescence spectra showed a dominated UV peak at 378 nm, and a much suppressed orange emission centered at similar to 590 nm. This demonstrates fairly good crystal quality and optical properties of the product. A possible three-step, zinc vapor-controlled process was proposed to explain the growth of well-aligned ZnO nanowall networks. The pre-coated ZnO template layer plays a key role during the synthesis process, which guides the growth direction of the synthesized products. (C) 2007 Elsevier B.V. All rights reserved.

Identificador

http://dspace.imech.ac.cn/handle/311007/33937

http://www.irgrid.ac.cn/handle/1471x/2817

Idioma(s)

英语

Fonte

Journal of Crystal Growth.2007,305(1):296-301

Palavras-Chave #Nanostructures #Physical Vapor Deposition Processes #Zno #Semiconducting Materials #Thin-Films #Optical-Properties #Vapor-Deposition #Growth-Mechanism #Nanowires #Nanosheets #Sapphire #Emission
Tipo

期刊论文