Metallographic Sample Prepared by Ion Beam Etching


Autoria(s): Xu XY; 张坤; Han JM; 陈光南
Data(s)

2004

Resumo

Ion beam etching technique was used to reveal the metallograhpic microstructure and interface morphology of electroplating chromium coating, in particular, whose substrate surface layer was treated in advance by laser quenching. Chemical etchings were, also conducted for comparison. The reveal microstructures were observed and analyzed by scanning electron microscopy. The results show that ion beam etching can reveal well the whole microstructures of composite coating-substrate materials.

Identificador

http://dspace.imech.ac.cn/handle/311007/15994

http://www.irgrid.ac.cn/handle/1471x/675

Palavras-Chave #力学
Tipo

期刊论文