In-situ flexural OPV measurements on flexible glass substrate


Autoria(s): Swathi, SK; Ramamurthy, Praveen C; Garner, Sean M
Data(s)

2015

Resumo

In-situ dark and light IV characteristics of inverted P3HT-PCBM devices on flexible glass substrates were measured while bending. Bending set up was simple and home built with servo controlled 2 parallel plate movements. ITO was sputter coated onto the thin flexible glass sheets of 25mmx25mm size in the lab. OPV devices were fabricated inside the glove box and conversion efficiency measured was about 2.8%. Bending of the device substrates and simultaneous PV measurements were carried out in ambient conditions. It was observed that the J(SC) and efficiency increased until the substrate breaking point but the V-OC and fill factor remained unchanged.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/53524/1/IEEE_Jou_Ele_Dev_Soc_3-36_250_2015.pdf

Swathi, SK and Ramamurthy, Praveen C and Garner, Sean M (2015) In-situ flexural OPV measurements on flexible glass substrate. In: IEEE 42nd Photovoltaic Specialist Conference (PVSC), JUN 14-19, 2015, New Orleans, LA.

Publicador

IEEE

Relação

http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7355724

http://eprints.iisc.ernet.in/53524/

Palavras-Chave #Others
Tipo

Conference Proceedings

NonPeerReviewed