Exact Phase Retrieval for a Class of 2-D Parametric Signals


Autoria(s): Shenoy, Basty Ajay; Seelamantula, Chandra Sekhar
Data(s)

2015

Resumo

We address the problem of two-dimensional (2-D) phase retrieval from magnitude of the Fourier spectrum. We consider 2-D signals that are characterized by first-order difference equations, which have a parametric representation in the Fourier domain. We show that, under appropriate stability conditions, such signals can be reconstructed uniquely from the Fourier transform magnitude. We formulate the phase retrieval problem as one of computing the parameters that uniquely determine the signal. We show that the problem can be solved by employing the annihilating filter method, particularly for the case when the parameters are distinct. For the more general case of the repeating parameters, the annihilating filter method is not applicable. We circumvent the problem by employing the algebraically coupled matrix pencil (ACMP) method. In the noiseless measurement setup, exact phase retrieval is possible. We also establish a link between the proposed analysis and 2-D cepstrum. In the noisy case, we derive Cramer-Rao lower bounds (CRLBs) on the estimates of the parameters and present Monte Carlo performance analysis as a function of the noise level. Comparisons with state-of-the-art techniques in terms of signal reconstruction accuracy show that the proposed technique outperforms the Fienup and relaxed averaged alternating reflections (RAAR) algorithms in the presence of noise.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/50743/1/iee_tra_sig_pro_63-1_90_2015.pdf

Shenoy, Basty Ajay and Seelamantula, Chandra Sekhar (2015) Exact Phase Retrieval for a Class of 2-D Parametric Signals. In: IEEE TRANSACTIONS ON SIGNAL PROCESSING, 63 (1). pp. 90-103.

Publicador

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Relação

http://dx.doi.org/ 10.1109/TSP.2014.2370935

http://eprints.iisc.ernet.in/50743/

Palavras-Chave #Electrical Engineering
Tipo

Journal Article

PeerReviewed