Spatially Adaptive Kernel Regression Using Risk Estimation


Autoria(s): Krishnan, Sunder Ram; Seelamantula, Chandra Sekhar; Chakravarti, Purvasha
Data(s)

2014

Resumo

An important question in kernel regression is one of estimating the order and bandwidth parameters from available noisy data. We propose to solve the problem within a risk estimation framework. Considering an independent and identically distributed (i.i.d.) Gaussian observations model, we use Stein's unbiased risk estimator (SURE) to estimate a weighted mean-square error (MSE) risk, and optimize it with respect to the order and bandwidth parameters. The two parameters are thus spatially adapted in such a manner that noise smoothing and fine structure preservation are simultaneously achieved. On the application side, we consider the problem of image restoration from uniform/non-uniform data, and show that the SURE approach to spatially adaptive kernel regression results in better quality estimation compared with its spatially non-adaptive counterparts. The denoising results obtained are comparable to those obtained using other state-of-the-art techniques, and in some scenarios, superior.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/48816/1/iee_sig_pro_let_21_4_445_2014.pdf

Krishnan, Sunder Ram and Seelamantula, Chandra Sekhar and Chakravarti, Purvasha (2014) Spatially Adaptive Kernel Regression Using Risk Estimation. In: IEEE SIGNAL PROCESSING LETTERS, 21 (4). pp. 445-448.

Publicador

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Relação

http://dx.doi.org/10.1109/LSP.2014.2305176

http://eprints.iisc.ernet.in/48816/

Palavras-Chave #Electrical Engineering
Tipo

Journal Article

PeerReviewed