Novel piezoelectric thin film impact sensor: application in non-destructive material discrimination


Autoria(s): Joshi, Sudeep; Hegde, GM; Nayak, MM; Rajanna, K
Data(s)

01/09/2013

Resumo

We report on the design, development, and performance study of a packaged piezoelectric thin film impact sensor, and its potential application in non-destructive material discrimination. The impact sensing element employed was a thin circular diaphragm of flexible Phynox alloy. Piezoelectric ZnO thin film as an impact sensing layer was deposited on to the Phynox alloy diaphragm by RF reactive magnetron sputtering. Deposited ZnO thin film was characterized by X-ray diffraction (XRD), Atomic Force Microscopy (AFM), and Scanning Electron Microscopy (SEM) techniques. The d(31) piezoelectric coefficient value of ZnO thin film was 4.7 pm V-1, as measured by 4-point bending method. ZnO film deposited diaphragm based sensing element was properly packaged in a suitable housing made of High Density Polyethylene (HDPE) material. Packaged impact sensor was used in an experimental set-up, which was designed and developed in-house for non-destructive material discrimination studies. Materials of different densities (iron, glass, wood, and plastic) were used as test specimens for material discrimination studies. The analysis of output voltage waveforms obtained reveals lots of valuable information about the impacted material. Impact sensor was able to discriminate the test materials on the basis of the difference in their densities. The output response of packaged impact sensor shows high linearity and repeatability. The packaged impact sensor discussed in this paper is highly sensitive, reliable, and cost-effective.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/47392/1/Sens_Actu_A_Phy_199_272_2013.pdf

Joshi, Sudeep and Hegde, GM and Nayak, MM and Rajanna, K (2013) Novel piezoelectric thin film impact sensor: application in non-destructive material discrimination. In: Sensors and Actuators A: Physical, 199 . pp. 272-282.

Publicador

Elsevier Science

Relação

http://dx.doi.org/10.1016/j.sna.2013.06.010

http://eprints.iisc.ernet.in/47392/

Palavras-Chave #Centre for Nano Science and Engineering #Instrumentation and Applied Physics (Formally ISU)
Tipo

Journal Article

PeerReviewed