Scattering of carriers by charged dislocations in semiconductors


Autoria(s): Bansal, Bhavtosh; Ghosh, Rituparna; Venkataraman, V
Data(s)

28/04/2013

Resumo

The scattering of carriers by charged dislocations in semiconductors is studied within the framework of the linearized Boltzmann transport theory with an emphasis on examining consequences of the extreme anisotropy of the cylindrically symmetric scattering potential. A new closed-form approximate expression for the carrier mobility valid for all temperatures is proposed. The ratios of quantum and transport scattering times are evaluated after averaging over the anisotropy in the relaxation time. The value of the Hall scattering factor computed for charged dislocation scattering indicates that there may be a factor of two error in the experimental mobility estimates using the Hall data. An expression for the resistivity tensor when the dislocations are tilted with respect to the plane of transport is derived. Finally, an expression for the isotropic relaxation time is derived when the dislocations are located within the sample with a uniform angular distribution.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/46757/1/Jou_Appl_Phys_113-16_163705_2013.pdf

Bansal, Bhavtosh and Ghosh, Rituparna and Venkataraman, V (2013) Scattering of carriers by charged dislocations in semiconductors. In: Journal of Applied Physics, 113 (16). 163705_1-163705_6.

Publicador

American Institute of Physics

Relação

http://dx.doi.org/10.1063/1.4803121

http://eprints.iisc.ernet.in/46757/

Palavras-Chave #Physics
Tipo

Journal Article

PeerReviewed