Direct Band-to-Band Tunneling in Reverse Biased MoS2 Nanoribbon p-n Junctions


Autoria(s): Ghosh, Ram Krishna; Mahapatra, Santanu
Data(s)

2013

Resumo

We investigate the direct band-to-band tunneling (BTBT) in a reverse biased molybdenum disulfide (MoS2) nanoribbon p-n junction by analyzing the complex band structure obtained from semiempirical extended Huckel method under relaxed and strained conditions. It is demonstrated that the direct BTBT is improbable in relaxed monolayer nanoribbon; however, with the application of certain uniaxial tensile strain, the material becomes favorable for it. On the other hand, the relaxed bilayer nanoribbon is suitable for direct BTBT but becomes unfavorable when the applied uniaxial tensile or compressive strain goes beyond a certain limit. Considering the Wentzel-Kramers-Brillouin approximation, we evaluate the tunneling probability to estimate the tunneling current for a small applied reverse bias. Reasonably high tunneling current in the MoS2 nanoribbons shows that it can take advantage over graphene nanoribbon in future tunnel field-effect transistor applications.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/46502/1/IEEE_tra_ele_dev_60_1_274_2013.pdf

Ghosh, Ram Krishna and Mahapatra, Santanu (2013) Direct Band-to-Band Tunneling in Reverse Biased MoS2 Nanoribbon p-n Junctions. In: IEEE TRANSACTIONS ON ELECTRON DEVICES, 60 (1). pp. 274-279.

Publicador

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Relação

http://dx.doi.org/10.1109/TED.2012.2226729

http://eprints.iisc.ernet.in/46502/

Palavras-Chave #Electronic Systems Engineering (Formerly, (CEDT) Centre for Electronic Design & Technology)
Tipo

Journal Article

PeerReviewed