High resolution multiple excitation spot optical microscopy


Autoria(s): Dilipkumar, Shilpa; Mondal, Partha Pratim
Data(s)

01/06/2011

Resumo

We propose fundamental improvements in three-dimensional (3D) resolution of multiple excitation spot optical microscopy. The excitation point spread function (PSF) is generated by two interfering counter-propagating depth-of-focus beams along the optical axis. Detection PSF is obtained by coherently interfering the emitted fluorescent light (collected by both the objectives) at the detector. System PSF shows upto 14-fold reduction in focal volume as compared to confocal, and almost 2-fold improvement in lateral resolution. Proposed PSF has the ability to simultaneously excite multiple 3D-spots of sub-femtoliter volume. Potential applications are in fluorescence microscopy and nanobioimaging. Copyright 2011 Author(s). This article is distributed under a Creative Commons Attribution 3.0 Unported License. [doi:10.1063/1.3598413]

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/44421/1/High_resolution.pdf

Dilipkumar, Shilpa and Mondal, Partha Pratim (2011) High resolution multiple excitation spot optical microscopy. In: Aip Advances, 1 (2).

Publicador

American Institute of Physics

Relação

http://aipadvances.aip.org/resource/1/aaidbi/v1/i2/p022128_s1

http://eprints.iisc.ernet.in/44421/

Palavras-Chave #Instrumentation and Applied Physics (Formally ISU)
Tipo

Journal Article

PeerReviewed