Raman signatures of pressure induced electronic topological and structural transitions in Bi2Te3


Autoria(s): Pradhan, Gopal K; Bera, Achintya; Kumar, Pradeep; Muthu, DVS; Sood, AK
Data(s)

01/02/2012

Resumo

We report Raman signatures of electronic topological transition (ETT) at 3.6 GPa and rhombohedral (alpha-Bi2Te3) to monoclinic (beta-Bi2Te3) structural transition at similar to 8 GPa. At the onset of ETT, a new Raman mode appears near 107 cm(-1) which is dispersionless with pressure. The structural transition at similar to 8 GPa is marked by a change in pressure derivative of A(1g) and E-g mode frequencies as well as by appearance of new modes near 115 cm(-1) and 135 cm(-1). The mode Grilneisen parameters are determined in both the alpha and beta-phases. (C) 2011 Elsevier Ltd. All rights reserved.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/44024/1/Raman_signatures.pdf

Pradhan, Gopal K and Bera, Achintya and Kumar, Pradeep and Muthu, DVS and Sood, AK (2012) Raman signatures of pressure induced electronic topological and structural transitions in Bi2Te3. In: Solid State Communications, 152 (4). pp. 284-287.

Publicador

Elsevier Science

Relação

http://dx.doi.org/10.1016/j.ssc.2011.11.029

http://eprints.iisc.ernet.in/44024/

Palavras-Chave #Physics
Tipo

Journal Article

PeerReviewed