Electron paramagnetic resonance study of porous silicon


Autoria(s): Bhat, SV; Victor, D; Muthu, S; Sood, AK; Jayaram, K
Data(s)

27/04/1992

Resumo

Electron paramagnetic resonance studies under ambient conditions of boron‐doped porous silicon show anisotropic Zeeman (g) and hyperfine (A) tensors, signaling localization of the charge carriers due to quantum confinement.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/42908/1/Electron_paramagnetic.pdf

Bhat, SV and Victor, D and Muthu, S and Sood, AK and Jayaram, K (1992) Electron paramagnetic resonance study of porous silicon. In: Applied Physics Letters, 60 (17). pp. 2116-2117.

Publicador

American Institute of Physics

Relação

http://apl.aip.org/resource/1/applab/v60/i17/p2116_s1

http://eprints.iisc.ernet.in/42908/

Palavras-Chave #Physics
Tipo

Journal Article

PeerReviewed