Measurement of 1/f noise and its application in materials science
Data(s) |
01/02/2002
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Resumo |
This is a review of the measurement of I If noise in certain classes of materials which have a wide range of potential applications. This includes metal films, semi-conductors, metallic oxides and inhomogeneous systems such as composites. The review contains a basic introduction to this field, the theories and models and follows it up with a discussion on measurement methods. There are discussions on specific examples of the application of noise spectroscopy in the field of materials science. (C) 2002 Elsevier Science Ltd. All rights reserved. |
Formato |
application/pdf |
Identificador |
http://eprints.iisc.ernet.in/39272/1/M_easurement_ofnoise_and.pdf Raychaudhuri, AK (2002) Measurement of 1/f noise and its application in materials science. In: Current Opinion in Solid State & Materials Science, 6 (1). pp. 67-85. |
Publicador |
Elsevier Science |
Relação |
http://dx.doi.org/10.1016/S1359-0286(02)00025-6 http://eprints.iisc.ernet.in/39272/ |
Palavras-Chave | #Physics |
Tipo |
Journal Article PeerReviewed |