Measurement of 1/f noise and its application in materials science


Autoria(s): Raychaudhuri, AK
Data(s)

01/02/2002

Resumo

This is a review of the measurement of I If noise in certain classes of materials which have a wide range of potential applications. This includes metal films, semi-conductors, metallic oxides and inhomogeneous systems such as composites. The review contains a basic introduction to this field, the theories and models and follows it up with a discussion on measurement methods. There are discussions on specific examples of the application of noise spectroscopy in the field of materials science. (C) 2002 Elsevier Science Ltd. All rights reserved.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/39272/1/M_easurement_ofnoise_and.pdf

Raychaudhuri, AK (2002) Measurement of 1/f noise and its application in materials science. In: Current Opinion in Solid State & Materials Science, 6 (1). pp. 67-85.

Publicador

Elsevier Science

Relação

http://dx.doi.org/10.1016/S1359-0286(02)00025-6

http://eprints.iisc.ernet.in/39272/

Palavras-Chave #Physics
Tipo

Journal Article

PeerReviewed